DE3010718A1 - High temp. measurement device - has sintered silicon diode sensor in glass body that has been repeatedly temp. cycled - Google Patents
High temp. measurement device - has sintered silicon diode sensor in glass body that has been repeatedly temp. cycledInfo
- Publication number
- DE3010718A1 DE3010718A1 DE19803010718 DE3010718A DE3010718A1 DE 3010718 A1 DE3010718 A1 DE 3010718A1 DE 19803010718 DE19803010718 DE 19803010718 DE 3010718 A DE3010718 A DE 3010718A DE 3010718 A1 DE3010718 A1 DE 3010718A1
- Authority
- DE
- Germany
- Prior art keywords
- temp
- diode
- measurement device
- glass body
- sensor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 title claims abstract description 4
- 229910052710 silicon Inorganic materials 0.000 title claims abstract description 4
- 239000010703 silicon Substances 0.000 title claims abstract description 4
- 239000011521 glass Substances 0.000 title abstract description 3
- 238000005259 measurement Methods 0.000 title abstract 2
- 238000000034 method Methods 0.000 claims abstract description 4
- 238000005245 sintering Methods 0.000 claims abstract description 4
- 239000004020 conductor Substances 0.000 abstract 2
- 230000001276 controlling effect Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/01—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using semiconducting elements having PN junctions
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Thermistors And Varistors (AREA)
Abstract
Description
Einrichtung zur Temperaturbestimmung Device for determining temperature
Gegenstand der Erfindung ist eine Einrichtung zur Temperaturbestimmung, insbesondere zur Steuerung und Regelung von Temperaturen über 200 Grad Celsius, z.B. Temperaturwächter mit selbständiger Weidereinschaltung.The invention relates to a device for determining temperature, especially for controlling and regulating temperatures over 200 degrees Celsius, E.g. temperature monitor with automatic switch-on.
Bekannte Einrichtungen bedienen sich hauptsächlich folgender Bauelemente: Thermoelemente, Heißleiter, Kaltleiter, Bimetalle.Well-known facilities mainly use the following components: Thermocouples, NTC thermistors, PTC thermistors, bimetals.
Die erwähnten Bauteile haben bei Anwendung über 200 Grad verschiedene Nachteile, nämlich, hoher Preis (Thermoelemente, Heißleiter, Kaltleiter), zu geringe Signalunterschiede (Thermoelemente, Heißleiter, Kaltleiter) und hysterese Erscheinungen (Bimetall).The components mentioned have different degrees when used over 200 degrees Disadvantages, namely, high price (thermocouples, NTC thermistors, PTC thermistors), too low Signal differences (thermocouples, NTC thermistors, PTC thermistors) and hysteresis phenomena (Bimetal).
Es ist Aufgabe der Erfindung, die erwähnten Nachteile zu beseitigen. Die Erfindung bedient sich einer Diode, als Temperatursensor, was an sich bekannt ist. Bei den bekannten Geräten ist der Anwendungsbereich jedoch begrenzt und zwar naximal bis@100 Grad Celsius. Eine Awendung bei nöheren Temperaturen scheiterte bisher an der Instabilität der Daten und der Funktionssicherheit.It is the object of the invention to eliminate the disadvantages mentioned. The invention uses a diode as a temperature sensor, which is known per se is. In the case of the known devices, however, the area of application is limited naximal up to @ 100 degrees Celsius. An application at higher temperatures failed so far because of the instability of the data and the functional reliability.
Die Herstellerfirmen ar an tieren deshalb ab etwa 175 Grad keine Werte und Funktionssicherheit mehr.The manufacturing companies therefore do not use values from around 175 degrees and functional reliability more.
Die Erfinden geht von einer handelsüblichen Diode als Temperatursensor aus und ist dadurch gekennzeichnet, daß die Diode einem Sintertrozeß ausx3Xesetzt wird. Zu deren Zweck wird die Diode zeitlich periodisch einer langsam ansteigenden und wieder zurückgehenden Temperatur ausesetzt.The invention is based on a commercially available diode as a temperature sensor off and is characterized in that the diode is exposed to a sintering process will. For this purpose, the diode is periodically increasing slowly and again exposed to decreasing temperature.
Es ist zweckmäßig eine Siliziumdiode im Glaskörper zu verwenden.It is advisable to use a silicon diode in the glass body.
Eine wesentliche Voraussetzung für die Funktionssicherheit ist, daß die Diode in Durchlaßrichtung mit einem relativ geringem Strom betrieben wiPd.An essential prerequisite for functional reliability is that the diode operated in the forward direction with a relatively low current wiPd.
Claims (1)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19803010718 DE3010718A1 (en) | 1980-03-20 | 1980-03-20 | High temp. measurement device - has sintered silicon diode sensor in glass body that has been repeatedly temp. cycled |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19803010718 DE3010718A1 (en) | 1980-03-20 | 1980-03-20 | High temp. measurement device - has sintered silicon diode sensor in glass body that has been repeatedly temp. cycled |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE3010718A1 true DE3010718A1 (en) | 1981-09-24 |
Family
ID=6097787
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE19803010718 Ceased DE3010718A1 (en) | 1980-03-20 | 1980-03-20 | High temp. measurement device - has sintered silicon diode sensor in glass body that has been repeatedly temp. cycled |
Country Status (1)
| Country | Link |
|---|---|
| DE (1) | DE3010718A1 (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4533898A (en) * | 1982-12-07 | 1985-08-06 | U.S. Philips Corporation | Symmetrical temperature sensor |
| US5369245A (en) * | 1991-07-31 | 1994-11-29 | Metron Designs Ltd. | Method and apparatus for conditioning an electronic component having a characteristic subject to variation with temperature |
| US6104075A (en) * | 1997-03-26 | 2000-08-15 | Nissan Motor Co., Ltd. | Semiconductor temperature sensor |
-
1980
- 1980-03-20 DE DE19803010718 patent/DE3010718A1/en not_active Ceased
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4533898A (en) * | 1982-12-07 | 1985-08-06 | U.S. Philips Corporation | Symmetrical temperature sensor |
| EP0111361B1 (en) * | 1982-12-07 | 1987-11-19 | Philips Patentverwaltung GmbH | Symmetric temperature sensor |
| US5369245A (en) * | 1991-07-31 | 1994-11-29 | Metron Designs Ltd. | Method and apparatus for conditioning an electronic component having a characteristic subject to variation with temperature |
| US6104075A (en) * | 1997-03-26 | 2000-08-15 | Nissan Motor Co., Ltd. | Semiconductor temperature sensor |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8110 | Request for examination paragraph 44 | ||
| 8131 | Rejection |