KR102418060B1 - Apparatus and method for diagnosing error correction code of flash memory - Google Patents

Abstract

A diagnostic apparatus and method for a flash memory ECC module are disclosed. A diagnostic apparatus for a flash memory ECC module according to an aspect of the present invention includes a flash memory module including at least one flash memory divided into a data area and a test area, and a flash memory controller configured to access the flash memory module, The flash memory controller is configured to diagnose whether the ECC module is operating normally based on an error correction code (ECC) module detecting an error of the flash memory, an ECC comparator test of the ECC module, and a test area test of the flash memory It includes a control module that

Description

Diagnostic device and method of flash memory ECC module {APPARATUS AND METHOD FOR DIAGNOSING ERROR CORRECTION CODE OF FLASH MEMORY}

The present invention relates to an apparatus and method for diagnosing a flash memory ECC (Error Correction Code) module, and more particularly, to a flash memory ECC module diagnostic for diagnosing whether an ECC module, which is an error detection logic of a flash memory, operates normally. It relates to an apparatus and method.

In recent years, as vehicles have become electronically controlled, functional safety of vehicles is becoming more important.

In particular, the memory error detection (detection) function of a microcontroller (MCU) in which input, operation, and output are made corresponds to a very important technology in preventing control malfunction.

Accordingly, in the prior art, in order to detect an error in the flash memory, when the microcontroller (MCU) activates the ECC (Error Correction Code) module, the ECC module operates in such a way that the error in the flash memory is detected.

However, there is no problem when the ECC module operates normally, but when the ECC module does not operate normally because it cannot detect the malfunction of the ECC module itself, there is a risk in detecting errors in the flash memory.

In other words, conventional self-diagnosis of the ECC module was impossible, and it was also impossible to distinguish (discrimination) the types of errors occurring in the flash memory test. That is, it was possible to know whether an error occurred only depending on the information of the ECC module.

Accordingly, there is a need for a method for verifying the presence or absence of errors in the ECC module.

Background art of the present invention is disclosed in Korean Patent Application Laid-Open No. 10-2015-0073717 (published on July 1, 2015, storage device and data encoding and decoding methods thereof).

The present invention has been devised to solve the above problems, and it is an object of the present invention to diagnose whether an ECC module, which is an error detection logic of a flash memory, operates normally. and to provide a method.

The problem to be solved by the present invention is not limited to the problem(s) mentioned above, and another problem(s) not mentioned will be clearly understood by those skilled in the art from the following description.

A diagnostic apparatus for a flash memory ECC module according to an aspect of the present invention includes a flash memory module including at least one flash memory divided into a data area and a test area, and a flash memory controller configured to access the flash memory module, The flash memory controller is configured to diagnose whether the ECC module is operating normally based on an error correction code (ECC) module detecting an error of the flash memory, an ECC comparator test of the ECC module, and a test area test of the flash memory It includes a control module that

In the flash memory, reference data may be stored in the data area, and test data generating an error with respect to the reference data may be stored in the test area.

In the present invention, the test data includes error correctable data obtained by flipping 1 bit or 2 bits of the reference data and uncorrectable data obtained by flipping 3 bits of the reference data. error) may be included.

In the present invention, the control module checks whether the error detection function of the ECC module operates properly through an ECC comparator test that ORs a specified value to generate an error in the test bit input port of the ECC comparator. can

In the present invention, the control module may check whether the error detection function of the ECC module operates properly by accessing the correctable error data stored in the test area.

In the present invention, the control module may access the uncorrectable error data stored in the test area to check whether the error detection function of the ECC module operates properly.

In the present invention, the control module compares the reference data of the data area with the test data of the text area before diagnosing whether the ECC module operates normally, and checks whether the test data of the test area is normally stored. and, if the test data is not normally stored, test data generating an error with respect to the reference data may be generated and stored in the test area.

In the present invention, when the test data is normally stored in the test area, the control module initializes, and in the initialization, a test operation in a test mode for performing the test is a powertrain control of a microcontroller (MCU) It may include settings for not affecting , and settings for Idle and ECC modules of the core to set up a test environment in a multi-core system.

In the present invention, when the diagnosis of the ECC module is completed, the control module may output the diagnosis result and release the initialization set for the diagnosis.

A method for diagnosing a flash memory ECC module according to another aspect of the present invention includes the steps of: determining, by a control module, whether test data is normally stored in a test area of a flash memory; and, if the test data is normally stored, the control module and diagnosing whether the ECC module operates normally based on the ECC comparator test of the ECC module and the test area test of the flash memory.

The present invention may further include the step of initializing, by the control module, settings for the core including the synchronization of the core and the idle of the core in the multi-core system before the determining step.

The present invention further comprises the step of the control module performing initialization for the test when the test data is normally stored, wherein the initialization is performed by a microcontroller (MCU) in a test mode for performing the test. ) may include settings for not affecting the powertrain control, and settings for Idle and ECC modules of the core to set up a test environment in a multi-core system.

In the present invention, if the test data is not normally stored, the control module may generate test data that generates an error with respect to the reference data and store the generated test data in the test area.

In the present invention, the test data includes error correctable data obtained by flipping 1 bit or 2 bits of the reference data and uncorrectable data obtained by flipping 3 bits of the reference data. error) may be included.

In the present invention, in the step of diagnosing whether the ECC module is operating normally, the control module performs an ECC comparator test in which a specified value is OR inputted to generate an error in the test bit input port of the ECC comparator. It can be checked whether the error detection function of the ECC module operates properly.

In the present invention, in the step of diagnosing whether the ECC module operates normally, the control module accesses the correctable error data stored in the test area to check whether the error detection function of the ECC module operates properly. can

In the present invention, in the step of diagnosing whether the ECC module operates normally, the control module accesses the uncorrectable error data stored in the test area to check whether the error detection function of the ECC module operates properly. can

The apparatus and method for diagnosing a flash memory ECC module according to an embodiment of the present invention can improve reliability of the ECC module by diagnosing whether the ECC module, which is an error detection logic of a flash memory, operates normally.

On the other hand, the effects of the present invention are not limited to the above-mentioned effects, and various effects may be included within the range obvious to those skilled in the art from the description below.

1 is a diagram illustrating an apparatus for diagnosing a flash memory ECC module according to an embodiment of the present invention.
2 is an exemplary diagram for explaining the configuration of a flash memory according to an embodiment of the present invention.
3 is an exemplary diagram for explaining a test of an ECC comparator according to an embodiment of the present invention.
4 is a flowchart illustrating a method for diagnosing a flash memory ECC module according to an embodiment of the present invention.

Hereinafter, an apparatus and method for diagnosing a flash memory ECC module according to an embodiment of the present invention will be described with reference to the accompanying drawings. In this process, the thickness of the lines or the size of the components shown in the drawings may be exaggerated for clarity and convenience of explanation. In addition, the terms to be described later are terms defined in consideration of functions in the present invention, which may vary according to the intention or custom of the user or operator. Therefore, definitions of these terms should be made based on the content throughout this specification.

Implementations described herein may be implemented in, for example, a method or process, an apparatus, a software program, a data stream, or a signal. Although discussed only in the context of a single form of implementation (eg, discussed only as a method), implementations of the discussed features may also be implemented in other forms (eg, as an apparatus or program). The apparatus may be implemented in suitable hardware, software and firmware, and the like. A method may be implemented in an apparatus such as, for example, a processor, which generally refers to a computer, a microprocessor, a processing device, including an integrated circuit or programmable logic device, and the like. Processors also include communication devices such as computers, cell phones, portable/personal digital assistants (“PDA”) and other devices that facilitate communication of information between end-users.

1 is a diagram illustrating a diagnostic apparatus for a flash memory ECC module according to an embodiment of the present invention, FIG. 2 is an exemplary view for explaining the configuration of a flash memory according to an embodiment of the present invention, and FIG. 3 is a diagram of the present invention It is an exemplary diagram for explaining the test of the ECC comparator according to an embodiment.

Referring to FIG. 1 , an apparatus for diagnosing a flash memory ECC module according to an embodiment of the present invention is a flash memory module including at least one flash memory 110a, 110b, .., 100n, hereinafter referred to as '110'). ( 100 ), a flash memory controller 200 configured to access the flash memory module 100 .

The flash memory module 100 includes a plurality of flash memories 110 , and each flash memory 110 may include a data area 112 and a test area 114 .

The data area 112 may store software and/or programs. The program may include a kernel, middleware, an application, a programming interface (API), and/or an application program, and the like. At least a portion of the kernel, middleware, or API may be referred to as an operating system (OS).

In addition, reference data for self-diagnosis of the ECC module 210 may be stored in the data area 112 .

Test data that generates an error with respect to the reference data stored in the data area 112 may be stored in the test area 114 . Here, the test data includes normal data (ie, reference data), error correctable data obtained by flipping 1 bit or 2 bits of the reference data (normal data), and 3 bits of the reference data (normal data). It may include flipped uncorrectable error data.

For example, reference data and test data may be stored in the data area 112 and the test area 114 as shown in FIG. 2 .

The flash memory controller 200 controls read, write, and erase operations on the flash memory 110 in response to a request from a host (not shown).

The flash memory controller 200 may include an error correction code (ECC) module 210 , a RAM (RAM) 220 , and a control module 230 .

The ECC module 210 generates an error correction code (ECC) for correcting a fail bit or an error bit of data received from the flash memory 110 . The ECC module 210 performs error correction encoding of data provided to the flash memory 110 to form data to which a parity bit is added. The parity bit may be stored in the flash memory 110 .

Meanwhile, the ECC module 210 may perform error correction decoding on data output from the flash memory 110 . The ECC module 210 may correct an error using parity. ECC module 210 is LDPC (low density parity check) code, BCH code, turbo code, Reed-Solomon code (Reed-Solomon code), convolution code, RSC (recursive systematic code), TCM (trellis-coded modulation), An error may be corrected by using coded modulation such as block coded modulation (BCM).

The ECC module 210 includes at least one ECC comparator therein, and the control module 230 selects a test mode and a powertrain control mode based on a program (or algorithm) for self-diagnosis of the ECC module 210 . choose This ensures that the test operation in the test mode does not affect the powertrain control.

The RAM 220 operates under the control of the control module 230 and may be used as a work memory, a buffer memory, a cache memory, and the like. When the RAM 220 is used as a work memory, data processed by the control module 230 is temporarily stored. When the RAM 220 is used as the buffer memory, it is used to buffer data to be transmitted from the host to the flash memory 110 or from the flash memory 110 to the host. When the RAM 220 is used as the cache memory, the low-speed flash memory 110 operates at a high speed.

The control module 230 may diagnose whether the ECC module 210 operates normally.

For reference, in order to diagnose whether the ECC module 210 operates normally in a multi-core system, the test should be performed while the core interlocked with the RAM 220 is stopped (or idle). Therefore, the control module 230 stops (or idles) the corresponding core operating in conjunction with the RAM 220 for diagnosing whether the ECC module 210 is normal, and then stops (or idles) the corresponding core when the test is completed. The core can be run again.

The control module 230 may diagnose whether the ECC module 210 is normal based on the ECC comparator test of the ECC module 210 and the test area 114 test of the flash memory 110 .

The control module 230 may check whether the error detection function of the ECC module 210 operates properly by performing a test of the ECC comparator shown in FIG. 3 . That is, the control module 230 OR input a specified value (eg 1) to generate an error in the test bit input port of the ECC comparator (in this case, input data input through the input port are all normal data) input), it can be checked whether the error detection function of the ECC module 210 operates properly through the ECC comparator test.

In addition, the control module 230 may access the test area 114 of the flash memory 110 to check whether the error detection function of the ECC module 210 operates properly.

Specifically, the control module 230 may access the correctable error data (Correctable Error) stored in the test area 114 to check whether the error detection function operates properly. That is, the control module 230 may check whether an error is detected by reading the correctable error data of the test area 114 . In this case, if it is detected that an error occurs as a result of reading the error correctable data of the test area 114 , the control module 230 may determine that the ECC module 210 is normal. If, as a result of reading the error correctable data of the test area 114 , an error is not detected, the control module 230 may determine that the ECC module 210 does not operate normally.

Also, the control module 230 may access the uncorrectable error data flashed in the test area 114 to check whether the error detection function operates properly. That is, the control module 230 may read the uncorrectable error data of the test area 114 and check whether the error is detected as an error occurrence. At this time, if it is detected that an error occurs as a result of reading the data that cannot be corrected for error in the test area 114 , the control module 230 may determine that the ECC module 210 is normal. If, as a result of reading the data that cannot be corrected for error in the test area 114 , an error is not detected, the control module 230 may determine that the ECC module 210 does not operate normally.

When an error is normally detected in the ECC comparator test and the test area test of the flash memory 110 , the control module 230 may diagnose the ECC module 210 as normal.

If an error is not normally detected in the ECC comparator test and the test area test of the flash memory 110 , the control module 230 determines that the ECC module 210 does not operate normally and generates a reset, the flash memory controller (200) can be prevented from being driven. When the flash memory controller 200 is reset, the control module 230 re-performs the ECC comparator test of the ECC module 210 and the test area test of the flash memory 110 to re-diagnose whether the ECC module 210 is normal. can

Meanwhile, when testing the test area of the flash memory 110 , the control module 230 uses the test data of the test area 114 , so reliability of the test data must be guaranteed. Accordingly, the control module 230 compares the reference data of the data area 112 with the test data of the text area before diagnosing whether the ECC module 210 is normal, and the test data of the test area 114 is normally stored. You can check whether it is At this time, the control module 230 places normal data having a normal ECC value in the test area 114 , and compares the normal data of the test area 114 with reference data of the data area 112 at every RunTime. Thus, it can be checked whether the test data of the test area 114 is normally stored. As a result of the check, if the test data is not normally stored, the control module 230 may generate the test data generating an error with respect to the reference data and store (flash) the test data in the test area 114 .

In addition, since the control module 230 performs a test on data stored in the flash memory 110 , reliability may not be ensured when the SW code for the test is located and performed in the flash memory 110 . . Accordingly, the control module 230 uploads the test SW code located in the flash memory 110 to the RAM 220, and can diagnose whether the ECC module 210 is normal through the test SW code located in the RAM 220. have. In this case, the reliability of the test SW code uploaded to the RAM 220 can guarantee the consistency of the test SW code through a CRC check before the execution of the test SW code.

In addition, the control module 230 may perform initialization for testing before performing the ECC comparator test and the test area test of the flash memory 110 . Here, the initialization is a setting to prevent the test operation in the test mode for performing the test from affecting the powertrain control of the microcontroller (MCU), and stopping the core (Idle) for setting the test environment in a multi-core system. ) and settings for the ECC module 210 . That is, due to the characteristics of the flash memory 110 , it is used in real time to control the electronic control unit (ECU), and since the flash memory 110 cannot change a value unlike the RAM 220, write/erase is impossible in real time. , there is a restriction that self-diagnosis of the ECC module 210 is impossible during control. Accordingly, the control module 230 may perform initialization before self-diagnosis of the ECC module 210 . When the diagnosis of the ECC module 210 is completed, the control module 230 may output a diagnosis result and release initialization set for diagnosis.

Meanwhile, the control module 230 may control overall operations (eg, read, write, file system management, bad page management, etc.) of the flash memory 110 . The control module 230 may include a central processing unit (CPU), a processor, an SRAM, a DMA controller, and the like.

As described above, in order to increase the reliability of the function of the ECC module 210, the diagnostic device of the flash memory ECC module 210 performs an error on the ECC module 210 itself before activation of the ECC module 210 for each driving cycle. Reliability of the ECC module 210 may be increased by performing the generation and actual ECC error generation tests.

4 is a flowchart illustrating a method for diagnosing a flash memory ECC module according to an embodiment of the present invention.

Referring to FIG. 4 , the control module 230 initializes a setting for a core for setting a test environment in a multi-core system (S402). That is, the control module 230 may synchronize the core in order to diagnose whether the ECC module 210 is normal, and stop (or idle) the corresponding core operating in conjunction with the corresponding RAM 220 .

When step S402 is performed, the control module 230 determines whether the test data is normally stored in the test area 114 of the flash memory 110 (S404).

As a result of the determination in step S404, if the test data is normally stored, the control module 230 performs initialization for the test of the ECC module 210 according to a preset setting (S406). For example, settings to ensure that test operations in test mode do not affect powertrain control (eg interrupts, trap backups, etc.) It may include a setting for 210 .

When step S406 is performed, the control module 230 performs a test of the ECC comparator (S408), and determines whether the error detection function of the ECC module 210 operates properly (S410). That is, the control module 230 OR input a specified value (eg 1) to generate an error in the test bit input port of the ECC comparator (in this case, input data input through the input port are all normal data) input), it can be checked whether the error detection function of the ECC module 210 operates properly through the ECC comparator test.

As a result of the determination in step S410 , if the error detection function of the ECC module 210 operates properly, the control module 230 accesses the correctable error data stored in the test area 114 ( S412 ) and detects the error It is determined whether the function operates properly (S414). That is, the control module 230 may access the correctable error data (Correctable Error) of the test area 114 and check whether an error is detected. At this time, if it is detected that an error occurs as a result of accessing the error correctable data of the test area 114 , the control module 230 may determine that the ECC module 210 is normal. If, as a result of accessing the error correctable data of the test area 114 , an error is not detected, the control module 230 may determine that the ECC module 210 does not operate normally.

As a result of the determination in step S414, if it is detected that an error occurs as a result of accessing the error correctable data of the test area 114, the control module 230 accesses the uncorrectable error data of the test area 114 (S416) ), it is determined whether the error detection function operates properly (S418). That is, the control module 230 may access the uncorrectable error data of the test area 114 and check whether it is detected as an error occurrence. At this time, if it is detected that an error occurs as a result of accessing the data that cannot be corrected for error in the test area 114 , the control module 230 may determine that the ECC module 210 is normal. If, as a result of accessing the data that cannot be corrected for error in the test area 114 , an error is not detected, the control module 230 may determine that the ECC module 210 does not operate normally.

As a result of the determination of step S418, if it is detected that an error occurs as a result of accessing the error correction impossible data of the test area 114, the control module 230 determines that the ECC module 210 is normal (S420), and the ECC module 210 ) release the initialization set for the test (S422).

If, as a result of the determination in step S404, the test data is not normally stored, the control module 230 generates and stores the test data generating an error with respect to the reference data in the test area 114 (S424), and in step S406 can be performed.

If, as a result of the determination in step S410 , the error detection function of the ECC module 210 does not operate properly, the control module 230 generates a reset of the flash memory controller 200 ( S426 ). When the flash memory controller 200 is reset, the control module 230 re-performs the ECC comparator test of the ECC module 210 and the test area test of the flash memory 110 to re-diagnose whether the ECC module 210 is normal. can

If, as a result of the determination in step S414 , when the error correctable data of the test area 114 is not detected as an error as a result of accessing it, the control module 230 generates a reset of the flash memory controller 200 ( S426 ).

As a result of the determination in step S418 , if it is not detected that an error has occurred as a result of accessing the data that cannot be corrected for error in the test area 114 , the control module 230 generates a reset of the flash memory controller 200 ( S426 ).

As described above, in the apparatus and method for diagnosing the flash memory ECC module 210 according to an embodiment of the present invention, the ECC module 210 by diagnosing whether the ECC module 210, which is the error detection logic of the flash memory, operates normally. ) can increase reliability.

Although the present invention has been described with reference to the embodiment shown in the drawings, this is merely an example, and those skilled in the art to which various modifications and equivalent other embodiments are possible. will understand

Accordingly, the true technical protection scope of the present invention should be defined by the following claims.

100: flash memory module
110: flash memory
200: flash memory controller
210: ECC module
220: ram
230: control module

Claims (17)

a flash memory module including at least one flash memory divided into a data area and a test area; and
a flash memory controller configured to access the flash memory module;
The flash memory controller,
an ECC (Error Correction Code) module for detecting an error of the flash memory; and
a control module for diagnosing whether the ECC module operates normally based on the ECC comparator test of the ECC module and the test area test of the flash memory;
The flash memory is
Reference data is stored in the data area,
The diagnostic apparatus of a flash memory ECC module, wherein test data that generates an error with respect to the reference data is stored in the test area.
a flash memory module including at least one flash memory divided into a data area and a test area; and
a flash memory controller configured to access the flash memory module;
The flash memory controller,
an ECC (Error Correction Code) module for detecting an error of the flash memory; and
a control module for diagnosing whether the ECC module operates normally based on the ECC comparator test of the ECC module and the test area test of the flash memory;
The control module is
The diagnostic apparatus of a flash memory ECC module, characterized in that it accesses uncorrectable error data stored in the test area and checks whether an error detection function of the ECC module operates properly.
According to claim 1,
The test data is
and error-correctable data obtained by flipping 1 bit or 2 bits of the reference data (Correctable Error) and error-correctable data obtained by flipping 3 bits of the reference data (Uncorrectable Error). A diagnostic device for flash memory ECC modules.
According to claim 1,
The control module is
Flash memory ECC module, characterized in that it is checked whether the error detection function of the ECC module operates properly through an ECC comparator test in which a specified value is ORed to generate an error in the test bit input port of the ECC comparator of diagnostic devices.
a flash memory module including at least one flash memory divided into a data area and a test area; and
a flash memory controller configured to access the flash memory module;
The flash memory controller,
an ECC (Error Correction Code) module for detecting an error of the flash memory; and
a control module for diagnosing whether the ECC module operates normally based on the ECC comparator test of the ECC module and the test area test of the flash memory;
The control module is
The diagnostic apparatus of the flash memory ECC module, characterized in that by accessing the correctable error data (Correctable Error) stored in the test area and checking whether the error detection function of the ECC module operates properly.
6. The method of claim 5,
The control module is
The diagnostic apparatus of a flash memory ECC module, characterized in that it accesses uncorrectable error data stored in the test area and checks whether an error detection function of the ECC module operates properly.
a flash memory module including at least one flash memory divided into a data area and a test area; and
a flash memory controller configured to access the flash memory module;
The flash memory controller,
an ECC (Error Correction Code) module for detecting an error of the flash memory; and
a control module for diagnosing whether the ECC module operates normally based on the ECC comparator test of the ECC module and the test area test of the flash memory;
The control module is
Before diagnosing whether the ECC module operates normally,
By comparing the reference data of the data area with the test data of the test area, it is checked whether the test data of the test area is normally stored, and if the test data is not normally stored, an error is generated for the reference data. A diagnostic device for a flash memory ECC module, characterized in that the test data is generated and stored in the test area.
8. The method of claim 7,
The control module is
When the test data is normally stored in the test area, initialization is performed,
The initialization includes setting so that the test operation in the test mode for performing the test does not affect the powertrain control of the microcontroller (MCU), and stopping the core for setting the test environment in the multi-core system ( Idle) and a diagnostic device of a flash memory ECC module, characterized in that it includes settings for the ECC module.
According to claim 1,
The control module is
When the diagnosis of the ECC module is completed, the diagnosis result is output and the initialization set for the diagnosis is released.
determining, by the control module, whether test data is normally stored in a test area of the flash memory; and
diagnosing, by the control module, whether the ECC module operates normally based on the ECC comparator test of the ECC module and the test area test of the flash memory, if the test data is normally stored;
If the test data is not normally stored, the control module generates test data that generates an error with respect to reference data and stores the generated test data in the test area.
11. The method of claim 10,
Prior to the step of determining,
The method for diagnosing a flash memory ECC module, characterized in that the control module initializes the setting for the core including the synchronization of the core and the idle of the core in the multi-core system.
11. The method of claim 10,
If the test data is normally stored, the control module further comprises the step of performing initialization for the test,
The initialization includes setting so that the test operation in the test mode for performing the test does not affect the powertrain control of the microcontroller (MCU), and stopping the core for setting the test environment in the multi-core system ( Idle) and a diagnostic method of a flash memory ECC module, characterized in that it includes a setting for the ECC module.
determining, by the control module, whether test data is normally stored in a test area of the flash memory; and
diagnosing, by the control module, whether the ECC module operates normally based on the ECC comparator test of the ECC module and the test area test of the flash memory, if the test data is normally stored;
In the step of diagnosing whether the ECC module operates normally,
wherein the control module accesses uncorrectable error data stored in the test area and checks whether an error detection function of the ECC module operates properly.
11. The method of claim 10,
The test data is
and error-correctable data obtained by flipping 1 bit or 2 bits of the reference data (Correctable Error) and error-correctable data obtained by flipping 3 bits of the reference data (Uncorrectable Error). How to diagnose flash memory ECC module.
11. The method of claim 10,
In the step of diagnosing whether the ECC module operates normally,
The control module checks whether the error detection function of the ECC module operates properly through an ECC comparator test in which a specified value is ORed to generate an error in the test bit input port of the ECC comparator. How to diagnose flash memory ECC module.
determining, by the control module, whether test data is normally stored in a test area of the flash memory; and
diagnosing, by the control module, whether the ECC module operates normally based on the ECC comparator test of the ECC module and the test area test of the flash memory, if the test data is normally stored;
In the step of diagnosing whether the ECC module operates normally,
and the control module accesses correctable error data stored in the test area and checks whether an error detection function of the ECC module operates properly.
17. The method of claim 16,
In the step of diagnosing whether the ECC module operates normally,
wherein the control module accesses uncorrectable error data stored in the test area and checks whether an error detection function of the ECC module operates properly.

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